有关X射线测厚仪技术的研究

靳其兵 吴磊
北京化工大学自动化研究所,北京100029
摘　要:对西门子PLC（可编程控制器）在薄膜测厚仪上的应用进行了研究，并比较了传统的以工控机为核心的电控系统与以PLC为电控核心的系统的优缺点。详细介绍了测厚仪电控系统的组成和原理，同时对测厚数据的处理方法进行了说明。实践表明，该系统控制结构简单，有较高的运行效率和可靠性。整套装置已成功运行在聚丙烯双向拉伸薄膜生产线上。[著者文摘]

Research on the Technique of X-ray Thickness GaugeAbstract:The application of SIEMENS PLC in thickness gauge of thin films is studied, and the merits and demerits of electric control systems based on industrial computer and PLC are compared. The composition and principle of the electric control system of the thickness gauge are introduced in detail, and the method of data processing is explained. The practice shows that the control system is simple, high efficient and reliable. The whole plant has been successfully used on production line of thin film of polypropylene.[著者文摘]

Key words:PLC Thickness gauge Data processing

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